Our LX4681A tester can measure thermal resistance.
This tester is used for evaluating LED thermal designs. It can be also used to perform failure analysis for problems occurring during the assembly process (cracking, die bonding failure, wire bonding failure, etc.). A good understanding of the thermal resistance is also an important concern for high powered LEDs.

By combining our LED testers with ESD units, it is possible to evaluate the anti-ESD characteristics of LEDs, perform line screening, and test whether LEDs have been received ESD damage.
This evaluation of LED anti-ESD characteristics (damage test), line screening and testing of ESD damage in LEDs can be performed at the wafer level (use with wafer probers) or at the completed product level (use measurement jigs or binning machines).

Our LED testers can be used together with integrating sphere to measure the amount of light emitted by an LED in all directions.

Our LX6136A can perform aging testing and pulse mode testing. Aging can be used to evaluate the reliability and durability of LEDs. See here (product introduction) for more information.

Our LX4681A can perform high current application testing. High currents and high voltages can be applied, up to a maximum of 1 A and 200 V. See here (product introduction) for more information.